MTI CORPORATION, USA

            Automatic 32-Sample XRF Scanning System for High Throughput Composition Analysis of

                                                             New Materials-EQ-XRF-32-LD


   


Features
  • The high throughput XRF station consists of:
    ▪ Handheld XRF spectrometer
    ▪ XRF spectrometer holder and triggering mechanism
    ▪ XY stage system and its control box
    ▪ 32-position transparent sample stage (no interference to XRF signal)
    ▪ Laptop with pre-installed control and analysis software
    ▪ Station cabinet with warning lights and lead glass for X-ray safety
  • The automatic operation improves efficiency, reduces operator related error, and minimize X-ray exposure
  • Fast, automatic XRF measurement and analysis of 32 samples (~20 min depending on the testing time), and automatic output of composition/spectrum data via a USB port
  • The XRF system can be upgraded with 1D line scan and 2D mapping scan features at the extra cost

    •                                        Please mouseOver picture below to see sample
                                                 

Power Input
  • XY stage: 220 VAC, 50/60 Hz, Single Phase
  • XRF spectrometer: 18 VDC input (100 - 240 VAC power adapter included)

XRF Spectrometer
  • X-ray Source
    ▪ X-ray tube: 4 W Rh target X-ray tube (optional Ag, Au, or Ta target available)
    ▪ Voltage: 40 kV max (50 kV option available)
    ▪ Current: 200 μA max
    ▪ Spot size: 3 mm (with collimator) and 9 mm
    ▪ Window Material: Beryllium (Be)
    ▪ Window guard: Kapton and Prolene window protection films

  • Detector
    ▪ SDD (Silicon drift detector): High energy resolution (165 eV FWHM) for general detection covering the whole element range
    ▪ Detector size: 25 mm2 large area detector for high count rate
    ▪ Window Material: Beryllium (Be)

  • Features
    ▪ An element library for alloy elements are pre-installed: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu,
     Zn,Zr, Nb,
    ▪ Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi (Customized element library is available upon request)
    ▪ Integrated CMOS camera for observing the measurement area on the sample surface
    ▪ Built-in sample proximity sensor to close X-ray shutter if no sample is detected near the detector
    ▪ USB / Bluetooth connection to a laptop for remote control and data output

XRF Holder & Trigger
  • A XRF spectrometer holder with trigger-pressing mechanism is integrated into the system for continuous, automatic measurement
  • The XRF measurement time can be controlled by setting the press-down time of the trigger mechanism

XY Sample Stage
  • Touch screen controlled XY stage for precise sample positioning and measurement repeatability
  • XRF measurement time, X- / Y- axis travel speed, sample selections can be configured on the control box touch screen
  • 32-sample transparent stage (no interference to XRF signal) for as-received arc melting samples (≤10 g) (max sample size: 20 mm) is included.
  • The sample is supported by XRF transparent Prolene film for maximized XRF signal

Station Cabinet
  • Station cabinet with warning lights and lead glass for X-ray operation safety
  • XY stage control box is integrated to the station cabinet
  • An optional high accuracy digital Geiger counter/dosimeter can be mounted on the cabinet for monitoring the radiation level (Click the photo below)
Net Weight
  • 20 Kg
Dimension
  • 820 x 680 x 1200 mm (L x D x H) (Depth with door open: 1050mm)












 

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